Equipment Type
Optical Profiler

Manufacturer
Bruker

Model
ContourX-200

Specifications

• Stitching, Advance High-Speed Autofocus, High-Speed measure
• Accurate & Repeatable throughout a 10mm Scan Range measure
• Patented Dual LED Illumination
• PSI, VSI, and UXI modes
• 6 inch automated and programmable XY stage

The Bruker ContourX-200 is a non-contact optical profiler capable of performing non-contact measurement and detailed analysis of large step heights and surface morphology.  The equipment is also capable to measure thick and thin film thickness. Ranging from ~100 nm to 100 µm.