Accurate & Repeatable throughout a 10mm Scan Range measure
Patented Dual LED Illumination
PSI, VSI, and UXI modes
6 inch automated and programmable XY stage
The Bruker ContourX-200 is a non-contact optical profiler capable of performing non-contact measurement and detailed analysis of large step heights and surface morphology. The equipment is also capable to measure thick and thin film thickness. Ranging from ~100 nm to 100 µm.